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• Integrated dust collector
magnification calibration specime
Large Ø25
Quantity=1
For nanoscale material property mapping of standard samples in the 10MPa to 10GPa hardness range
7.4mm Tall Head, Ø12.7mm x 8mm pin height for TFS/FEI, TESCAN, ZEISS (also for Philips, LEO, Cambridge, Leica, CamScan) Bulk Holders • Integrated dust collectorDESCRIPTION FEI, TESCAN, ZEISS (also for Philips, LEO, Cambridge, Leica, CamScan) aluminum, grooved edge, 12. 7mm. Note: Sold in 10 50 100 packs.
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