PR-UM-PFIR-A-10 80 N/m scanning capacitance microscopy (SCM)

scanning capacitance microscopy (SCM)

619 (417KB PDF)

curved tips 7 115mm NM-SS 0

Boron doped silicon wafer with a resistivity of 5-10 Ohm/cm

This AFM probe is unmounted for use on any AFM and is also available with Aluminum reflex coating as model RFESPA-190

PR-UM-PFIR-A-10 80 N/m scanning capacitance microscopy (SCM)DESCRIPTION SPECIFICATIONS A 10 pack of probes for PeakForce Tapping mode imaging and nanoIR spectroscopic measurements. Unmounted for use on Brukers IconIR system or others systems that can take a standard cantilever chip. This 150khz tapping mode probe has a full wrap gold coating, on the reflex side for increased feedback laser signal, on the tip side to enable nanoIR measurements. General Specifications Feature Value Geometry Rectangular Tip